[jira] [Created] (FLINK-14705) Remove nullables argument of BatchTestBase.registerCollection in blink planner

[Shang Yuanchun (Jira)]

Danny Chen created FLINK-14705:
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             Summary: Remove nullables argument of BatchTestBase.registerCollection in blink planner
                 Key: FLINK-14705
                 URL: https://issues.apache.org/jira/browse/FLINK-14705
             Project: Flink
          Issue Type: Improvement
            Reporter: Danny Chen


The register collection method use TypeInformation to register collections, the type information does not have nullability attribute, we expect to use the new DataType instead.

So for these test cases,



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